KLARF Viewer
Simple and innovative Defect Metrology Solution
KLARF Viewer
KLARF Viewer is an essential tool in the semiconductor industry for analyzing and visualizing defect data captured during wafer inspection. It enables engineers to interpret KLARF files efficiently, providing detailed insights into defect locations, sizes, and patterns. By streamlining data review, KLARF Viewers support faster root-cause analysis and process optimization. This tool is vital for ensuring high yield and maintaining the quality of semiconductor manufacturing processes.
KLARF Viewer
specifications
KLARF Viewer, developed by LVtailoring, is a unique solution designed for Defect Metrology engineers, providing a comprehensive platform for reviewing Defect KLARF Maps enhanced by deep learning classification models. The tool enables classification of defect maps based on the spatial distribution of defects, as well as user-selected individual defect analysis. Additionally, KLARF Viewer by LVTS allows merging of multiple KLARF files and classification of the resulting merged signatures for advanced defect analysis.
Why LVTailoring?
Same Hardware
No need for new, highly-specialized, and expensive hardware
Same System
Re-invest in the power of your business with our innovative solution
New Capabilities
Control your capital costs, solve your performance issues and achieve your goals with ease
Save your capital dollars.
Allow us to unlock the full potential of your existing tools – using the same system, same hardware , and new software - for brand new capabilities.
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