Measurement Suite
innovative, specialized measurement solution.
Inspection
We could configure Measurement Suite to handle Inspection solution for you.
Finding defects on any patterned or unpatterned images with full additional information about location, size and severety.
We could also provide all required statistics and post processing calculation required to handle continious manufacturing issues as well as excusion prevention setup.
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Specialized Applications
Measurment Suite could comprize also highly sophisticated AI modelling solution.
Customer could collect required data per our suggestion and we will create highly intellegent agent based AI to trasnform observed parameters to required ones.
For example it is not trivial task to estimate edge slope roughness or depths of plug material based on secondary electon emission - we can handle these tasks
We can make customization our solution to be suited to your immediate needs.
Specialized Applications
Tailoring software to meet particular needs and fulfill specific tasks is achievable by creating new features, adjusting existing functionality, incorporating with other systems, or enhancing performance for particular scenarios.
Understanding the distinct needs and requirements of a project is crucial for the development of customized software. This encompasses acquiring detailed information about desired features, user interface, data management, integration points, and other pertinent aspects. Once the requirements are well-defined, the software development process usually encompasses various stages, including design, implementation, testing, and deployment.
Mass Measurement
We can do mass measurement.
Mass measurement can indeed be performed for various purposes in semiconductor manufacturing, including stochastic definition and defects inspection.
Stochastic definition refers to the statistical analysis of variations in mass distribution within a semiconductor wafer.Mass measurement can provide valuable information about process variations and potential sources of defects. By analyzing the mass distribution, manufacturers can gain insights into the uniformity and consistency of the manufacturing process, leading to process improvements and enhanced yield.
Defects inspection is another important application of mass measurement. By measuring the mass of individual features or structures on a semiconductor wafer, manufacturers can identify and classify defects. Deviations in mass can indicate the presence of contaminants, irregularities, or other defects that can affect the performance or reliability of the fabricated devices.
Why LVTailoring?
Same Hardware
No need for new, highly-specialized, and expensive hardware
Same System
Re-invest in the power of your business with our innovative solution
New Capabilities
Control your capital costs, solve your performance issues and achieve your goals with ease
Save your capital dollars.
Allow us to unlock the full potential of your existing tools – using the same system, same hardware , and new software - for brand new capabilities.
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